Methods and apparatus for forming rhodium-containing layers

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United States of America Patent

PATENT NO 7393785
APP PUB NO 20070197031A1
SERIAL NO

11789787

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Abstract

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A method of forming a rhodium-containing layer on a substrate, such as a semiconductor wafer, using complexes of the formula L.sub.yRhY.sub.z is provided. Also provided is a chemical vapor co-deposited platinum-rhodium alloy barriers and electrodes for cell dielectrics for integrated circuits, particularly for DRAM cell capacitors. The alloy barriers protect surrounding materials from oxidation during oxidative recrystallization steps and protect cell dielectrics from loss of oxygen during high temperature processing steps. Also provided are methods for CVD co-deposition of platinum-rhodium alloy diffusion barriers.

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Patent OwnerAddress
MICRON TECHNOLOGY INCBOISE ID

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Marsh, Eugene P Boise, ID 226 6251
Uhlenbrock, Stefan Boise, ID 70 2459

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