Method for measuring the separation of extended objects in conjunction with an optical observation system and microscope for carrying out the same
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United States of America Patent
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Jul 1, 2008
Grant Date -
Jan 16, 2003
app pub date -
May 29, 2002
filing date -
May 29, 2001
priority date (Note) -
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Abstract
Method and device for determining one or more Z distances from an object surface to a reference plane, for example the primary plane of the primary objective of a microscope. By projecting an optical pattern onto an object, and subsequently detecting and computationally evaluating the object's reflection of this pattern by means of an image processing unit, it is possible to obtain relief-like imaging of the object and to identify the individual Z distances, irrespective of the object's contouring.
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