X-ray inspection system
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United States of America Patent
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Jul 15, 2008
Grant Date -
Sep 27, 2007
app pub date -
Sep 28, 2006
filing date -
Sep 30, 2005
priority date (Note) -
In Force
status (Latency Note)
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Abstract
An x-ray inspection system (198) arranged to inspect at least one object and comprising: a source of radiation (200) a detector (216), in use, capable of detecting the radiation passing through an irradiation zone (214) and generating a periodic output of data therefrom; processing circuitry arranged to process the output generated by the detector (216); a speed determination means (228) arranged, in use, to determine and output to the processing circuitry the speed at which an object passes the detector (216); wherein the processing circuitry is arranged to vary the period of the output of the detector (216) according to the output from the speed determination means (228).
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