Test structure and probe for differential signals

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United States of America Patent

PATENT NO 7403028
APP PUB NO 20070285111A1
SERIAL NO

11710149

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Abstract

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A test structure including a differential gain cell and a differential signal probe include compensation for the Miller effect reducing the frequency dependent variability of the input impedance of the test structure.

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Patent Owner(s)

Patent OwnerAddress
CASCADE MICROTECH INC2430 NW 206TH AVENUE BEAVERTON OR 97006

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Campbell, Richard Portland, OR 33 296

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