Apparatus and method for measuring optical characteristics of an object
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United States of America Patent
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Jul 22, 2008
Issued Date -
N/A
app pub date -
Mar 21, 2005
filing date -
Jul 1, 1997
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method for determining spectral characteristics of an object is disclosed. A probe is positioned in proximity relative to the object. The probe provides light from at least first and second light sources positioned first and second distances from a central light receiver. The first light source and the central light receiver define a first critical height from the surface below which no specularly reflected light from the first light source is received by the central light receiver, and the second light source and the central light receiver define a second critical height from the surface below which no specularly reflected light from the second light source is received by the central light receiver. The first critical height is different from the second critical height.
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