Extraction of imperfection features through spectral analysis
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United States of America Patent
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Jul 22, 2008
Grant Date -
Sep 20, 2007
app pub date -
May 2, 2007
filing date -
Nov 22, 2004
priority date (Note) -
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Abstract
Autonomous non-destructive inspection equipment provides automatic and/or continuous inspection and evaluation of a material under inspection. The inspection equipment preferably comprises at least one detection sensor and at least one detection sensor interface for a computer. The autonomous non-destructive inspection system may also be retrofitted into conventional inspection systems by extracting pertinent features through spectral frequency analysis and sensor compensation and utilizing those features in the autonomous non-destructive inspection system.
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