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• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

Patent Owner	Address
CARL ZEISS OPTOTECHNIK GMBH	GEORG-WIESBOECK-RING 12 NEUBEUERN 83115

International Classification(s)

• G01B:MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIME....

• [Classification Symbol]

• [Patents Count]

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Adlhart, Manfred	Kosen, AT	1	49
Andr, Peter	Neubeuern, DE	1	40
Basel, Markus	Bischofsheim, DE	4	58
Kaus, Michael	Bensheim/Auerbach, DE	34	634
Lazar, Markus	Nussdorf, DE	2	50
Maidhof, Armin	Kolbermoor, DE	3	66
Nasswetter, Thomas	Raubling, DE	2	52
Steinbichler, Hans	Neubeuern, DE	11	807
Thoss, Frank	Neubeuern, DE	1	49

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Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
August 19, 2008	US,7414732,B2   US7414732B2	GRANTED PATENT AS SECOND PUBLICATION
June 19, 2003	US,20030112448,A1   US20030112448A1	FIRST PUBLISHED PATENT APPLICATION

Full Text

US Patent No: 7414732

Method and device for determining the 3D profile of an object

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