Systems and methods for measuring color and contrast in specular reflective devices
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Aug 26, 2008
Grant Date -
Mar 30, 2006
app pub date -
Aug 5, 2005
filing date -
Sep 27, 2004
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
Disclosed herein are systems and methods for measuring color and contrast in specular reflective devices such as interferometric modulators. To make color and contrast determinations, light reflected from a specular reflective device may be measured in-line with illumination of the device. The measurements may include measuring the spectra of light reflected from the device being tested as well as from specular bright and dark standards. The spectra may be used to determine a reflectance spectrum and color parameters for the specular reflective device.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully