Condition assessment system for a structure including a semiconductor material
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Sep 2, 2008
Grant Date -
Jan 25, 2007
app pub date -
Sep 28, 2006
filing date -
Jul 26, 1999
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
An improved condition testing system and method includes a structure including a semiconductor material with a target portion and a second portion. The target portion has a first feature when at least one of the following occurs: an external force is received by the second portion of the structure and an internal condition occurs in the target portion. The system and method further has a grating shaped and located to produce a first optical interference pattern when the target portion and the grating are exposed to non-invasive illumination and when the target portion has the first feature. Further implementations use a second grating spaced apart from the first grating.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully