Method to evaluate whether a time delay is better than a time limit
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United States of America Patent
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Sep 9, 2008
Grant Date -
Nov 2, 2006
app pub date -
Oct 1, 2003
filing date -
Oct 18, 2002
priority date (Note) -
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status (Latency Note)
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Abstract
A method for testing the time delay error ratio ER of a device against a maximal allowable time delay error ratio ER.sub.limit with an early pass and/or early fail criterion, whereby the early pass and/or early fail criterion is allowed to be wrong only by a small probability D. ns time delays TD of the device are measured, thereby ne bad time delays of these ns time delays TD are detected. PD.sub.high and/or PD.sub.low are obtained, whereby PD.sub.high is the worst possible likelihood distribution and PD.sub.low is the best possible likelihood distribution containing the measured ne bad time delays with the probability D. The average numbers of erroneous bits NE.sub.high and NE.sub.low for PD.sub.high and PD.sub.low are obtained. NE.sub.high and NE.sub.low are compared with NE.sub.limit=ER.sub.limit ns. If NE.sub.limit is higher than NE.sub.high or NE.sub.limit is lower than NE.sub.low the test is stopped.
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