Method and apparatus to monitor stress conditions in a system
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United States of America Patent
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Sep 9, 2008
Grant Date -
Apr 19, 2007
app pub date -
Sep 26, 2005
filing date -
Sep 26, 2005
priority date (Note) -
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Abstract
Faults are monitored with information from agents for a plurality of sensors located on a plurality of circuit boards. A policy containing a error event thresholds against which the stored sensor information can be compared. Actions can be initiated by a fault module when one or more of the error event thresholds is exceeded.
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