High performance CCD-based thermoreflectance imaging using stochastic resonance
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United States of America Patent
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Sep 30, 2008
Grant Date -
Dec 7, 2006
app pub date -
Mar 15, 2006
filing date -
Mar 15, 2005
priority date (Note) -
Expired
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Abstract
The invention is directed to systems and methods of digital signal processing and in particular to systems and methods for measurements of thermoreflectance signals, even when they are smaller than the code width of a digital detector used for detection. For example, in some embodiments, the number of measurements done is selected to be sufficiently large so as to obtain an uncertainty less than the code width of the detector. This allows for obtaining images having an enhanced temperature resolution. The invention is also directed to methods for predicting the uncertainty in measurement of the signal based on one or more noise variables associated with the detection process and the number of measurement iterations.
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