Lithographically optimized placement tool

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United States of America Patent

PATENT NO 7434188
SERIAL NO

11372557

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Abstract

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A system and a method are disclosed for integrating the results of lithographic simulation into the physical synthesis process. The effects of lithographic variation are considered when selecting a cell from among a group of cells having equivalent function. Circuit design elements are placed and routed with consideration of the effects of lithographic variation on robustness, timing performance, and leakage current. Cells may be simulated under a variety of conditions and environments and the simulation results stored in a library for efficient lithographically optimized placements.

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Patent Owner(s)

Patent OwnerAddress
SYNOPSYS INC675 ALMANOR AVENUE SUNNYVALE CA 94085

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Devgan, Anirudh Austin, TX 31 973
Metcalfe, Roderick Farnham, GB 1 2
Raghavan, Vivek Mountain View, CA 7 218
Wong, Alfred Brookline, MA 23 372

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