SEM test apparatus

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United States of America Patent

PATENT NO 7436177
SERIAL NO

11418081

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Test apparatus for examining the operation and functioning of ultra-small resonant structures, and specifically using an SEM as the testing device and its electron beam as an exciting source of charged particles to cause the ultra-small resonant structures to resonate and produce EMR.

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Patent Owner(s)

  • V.I. FOUNDERS, LLC

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Davidson, Mark Florahome, FL 89 3746
Gorrell, Jonathan Gainesville, FL 69 998
Tokarz, Jean Hawthorne, FL 12 282

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