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• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

• CASCADE MICROTECH, INC.

International Classification(s)

• G01R:MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC V....

• [Classification Symbol]

• [Patents Count]

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Andrews, Mike	Cornelius, OR	61	1554
Dunklee, John	Tigard, OR	36	575
Gleason, K Reed	Portland, OR	49	1830
Hayden, Leonard	Beaverton, OR	26	485
Lesher, Tim	Portland, OR	18	262
Martin, John	Portland, OR	225	6159
Safwat, Amr M E	Cairo, EG	8	170
Strid, Eric W	Portland, OR	33	2089

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Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
October 14, 2008	US,7436194,B2   US7436194B2	GRANTED PATENT AS SECOND PUBLICATION
February 28, 2008	US,20080048692,A1   US20080048692A1	FIRST PUBLISHED PATENT APPLICATION

Full Text

US Patent No: 7436194

Shielded probe with low contact resistance for testing a device under test

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