On-wafer test structures for differential signals
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Oct 28, 2008
Issued Date -
N/A
app pub date -
Mar 9, 2007
filing date -
Jun 12, 2006
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A test structure for characterizing integrated circuits on a wafer includes a differential cell outputting a differential mode signal in response to a differential mode input signal. The probe pads of the test structure are arrayed linearly enabling placement of the test structure in a saw street between dies.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully