Non-volatile memory and method with reduced bit line crosstalk errors
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United States of America Patent
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Oct 28, 2008
Grant Date -
Mar 25, 2004
app pub date -
Sep 24, 2002
filing date -
Sep 24, 2002
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Abstract
A memory device and a method thereof allow sensing a plurality of memory cells in parallel while minimizing errors caused by bit-line to bit-line crosstalk. Essentially, the bit line voltages of the plurality of bit line coupled to the plurality of memory cells are controlled such that the voltage difference between each adjacent pair of lines is substantially independent of time while their conduction currents are being sensed. When this condition is imposed, all the alternate currents due to the various bit line capacitance drop out since they all depend on a time varying voltage difference. In another aspect, sensing the memory cell's conduction current is effected by noting its rate of discharging a dedicated capacitor provided in the sense amplifier.
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Patent Owner(s)
| Patent Owner | Address | |
|---|---|---|
| SANDISK TECHNOLOGIES LLC | 6900 DALLAS PARKWAY SUITE 325 PLANO TX 75024 |
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Inventor(s)
| Inventor Name | Address | # of filed Patents | Total Citations |
|---|---|---|---|
| Cernea, Raul-Adrian | Santa Clara, CA | 131 | 7455 |
| Li, Yan | Milpitas, CA | 1447 | 20982 |
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