Wafer probe

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 7456646
APP PUB NO 20080042677A1
SERIAL NO

11975175

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The present invention relates to a probe for testing of integrated circuits or other microelectronic devices.

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Patent Owner(s)

  • CASCADE MICROTECH, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Andrews, Mike Hillsboro, OR 61 1625
Hayden, Leonard Beaverton, OR 26 488
Martin, John Portland, OR 232 6499

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