Method and apparatus for embedded built-in self-test (BIST) of electronic circuits and systems
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United States of America Patent
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Dec 16, 2008
Grant Date -
Sep 22, 2005
app pub date -
May 16, 2005
filing date -
Dec 4, 2001
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An embedded electronic system built-in self-test controller architecture that facilitates testing and debugging of electronic circuits and in-system configuration of programmable devices. The system BIST controller architecture includes an embedded system BIST controller, an embedded memory circuit, an embedded IEEE 1149.1 bus, and an external controller connector. The system BIST controller is coupled to the memory circuit and the IEEE 1149.1 bus, and coupleable to an external test controller via the external controller connector. The external test controller can communicate over the IEEE 1149.1 bus to program the memory and/or the system BIST controller circuitry, thereby enabling scan vectors to be debugged by the external test controller and then downloaded into the memory for subsequent application to a unit under test by the system BIST controller.
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