Method for detecting a mass density image of an object

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United States of America Patent

PATENT NO 7469037
APP PUB NO 20080247511A1
SERIAL NO

11732343

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Abstract

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A method for detecting a mass density image of an object. An x-ray beam is transmitted through the object and a transmitted beam is emitted from the object. The transmitted beam is directed at an angle of incidence upon a crystal analyzer. A diffracted beam is emitted from the crystal analyzer onto a detector and digitized. A first image of the object is detected from the diffracted beam emitted from the crystal analyzer when positioned at a first angular position. A second image of the object is detected from the diffracted beam emitted from the crystal analyzer when positioned at a second angular position. A refraction image is obtained and a regularized mathematical inversion algorithm is applied to the refraction image to obtain a mass density image.

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Patent Owner(s)

Patent OwnerAddress
ILLINOIS INSTITUTE OF TECHNOLOGYCHICAGO IL

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Wernick, Miles N Chicago, IL 8 55
Yang, Yongyi Westmont, IL 30 214

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