Autonomous self-monitoring and corrective operation of an integrated circuit
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United States of America Patent
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Dec 30, 2008
Grant Date -
Aug 25, 2005
app pub date -
Feb 24, 2004
filing date -
Feb 24, 2004
priority date (Note) -
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Abstract
Disclosed is a method and apparatus for autonomously self-monitoring and self-adjusting the operation of an integrated circuit device throughout the integrated circuit device's useful life. The invention periodically performs performance self-testing on the integrated circuit device throughout the integrated circuit devices useful life. The invention also evaluates whether results from the self-testing are within acceptable limits and self-adjusts parameters of the integrated circuit device until the results from the self-testing are within the acceptable limits.
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