Specimen analysis system obtaining characteristic of specimen by diffusion approximation

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United States of America Patent

PATENT NO 7477393
APP PUB NO 20070073157A1
SERIAL NO

11523501

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Abstract

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In a specimen analysis system: a light injection unit selectively injects unscattered light and scattered light into a specimen at an incident position on the specimen, and an information processing unit performs calculation of a characteristic of the specimen by diffusion approximation, where the calculation of the characteristic in a near-incident-point region located within a predetermined distance from the incident position is based on information carried by light which exits from the near-incident-point region of the specimen in response to injection of the scattered light into the specimen, and the calculation of the characteristic in a remote region located farther from the incident position than the near-incident-point region is based on information carried by light which exits from the remote region in response to injection of the unscattered light into the specimen.

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Patent Owner(s)

Patent OwnerAddress
FUJIFILM CORPORATIONTOKYO 106-8620

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Sendai, Tomonari JP 59 1439

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