Designing an integrated circuit to improve yield using a variant design element
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United States of America Patent
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Feb 3, 2009
Grant Date -
May 11, 2006
app pub date -
Nov 17, 2003
filing date -
Jan 2, 2003
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An integrated circuit is designed to improve yield when manufacturing the integrated circuit, by obtaining a design element from a set of design elements used in designing integrated circuits. A variant design element is created based on the obtained design element, where a feature of the obtained design element is modified to create the variant design element. A yield to area ratio for the variant design element is determined. If the yield to area ratio of the variant design element is greater than a yield to area ratio of the obtained design element, the variant design element is retained to be used in designing the integrated circuit.
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