Method and apparatus for three-dimensional measurement
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United States of America Patent
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Feb 10, 2009
Grant Date -
Jun 28, 2007
app pub date -
Dec 21, 2006
filing date -
Dec 26, 2005
priority date (Note) -
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Abstract
A three-dimensional measurement method for conducting measurement of a three-dimensional shape of a surface of an object using a three-dimensional measuring device is provided. The method includes providing, in advance, a posture sensor that detects a posture of the three-dimensional measuring device, providing, in advance, a parameter table in which a parameter corresponding to a posture of the three-dimensional measuring device is stored, and calculating three-dimensional shape data of the object using measurement data and the parameter, the measurement data being obtained by conducting measurement of the object with the three-dimensional measuring device and the parameter being read out from the parameter table according to a posture of the three-dimensional measuring device upon the measurement.
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