Chuck for holding a device under test
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United States of America Patent
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-
Feb 17, 2009
Grant Date -
Nov 25, 2004
app pub date -
Apr 21, 2004
filing date -
May 23, 2003
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A chuck that includes an upper surface for supporting a device under test and a conductive element that extends through the chuck to the upper surface of the chuck. The conductive element is electrically isolated from the upper surface of the chuck, and makes electrical contact with any device under test supported by the chuck.
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