Image defect inspection method, image defect inspection apparatus, and appearance inspection apparatus
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United States of America Patent
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Feb 17, 2009
Grant Date -
May 11, 2006
app pub date -
Aug 17, 2005
filing date -
Nov 11, 2004
priority date (Note) -
Expired
status (Latency Note)
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Abstract
In an image defect inspection method and apparatus, which detects a gray level difference between the corresponding portions of two images, automatically sets a threshold value based on the distribution of the detected gray level difference, compares the detected gray level difference with the threshold value, and judges one or the other of the portions to be defective if the gray level difference is larger than the threshold value, provisions are made to reduce the occurrence of false defects when there is a brightness difference between the two images undergoing the comparison. In the image defect inspection method, the brightness difference between the two images is computed (S106), and the threshold value is determined in such a manner that the threshold value increases with the computed brightness difference (S107).
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