Method and system for improving accuracy in autorefraction measurements by including measurement distance between the photorecptors and the scattering location in an eye

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United States of America Patent

PATENT NO 7494220
APP PUB NO 20040046935A1
SERIAL NO

10640321

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Abstract

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A method and associated system improve accuracy in objective refraction measurements by including the measured distance between the photoreceptors of a subject's eye and the scattering location of light during the objective refraction measurements. Chromatic aberrations in the objective measurements are also compensated. The distance between the photoreceptors and the scattering location may be determined by adjusting a distance between a rotating speckled light pattern and an eye until the speckled light pattern appears to be stationary, or by employing a Scheiner disk.

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Patent Owner(s)

Patent OwnerAddress
AMO DEVELOPMENT LLC31 TECHNOLOGY DRIVE SUITE 200 IRVINE CA 92618

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Copland, Richard James Albuquerque, US 10 404

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