Wafer probe

United States of America Patent

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Feb 24, 2009
Grant Date
Feb 21, 2008
app pub date
Oct 18, 2007
filing date
Dec 4, 2000

priority date (Note)
Expired

status (Latency Note)

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Abstract

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The present invention relates to a probe for testing of integrated circuits or other microelectronic devices.

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Patent Owner(s)

CASCADE MICROTECH, INC.

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[Patents Count]

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Andrews, Mike	Hillsboro, US	61	1625
Hayden, Leonard	Beaverton, US	26	488
Martin, John	Portland , US	232	6499

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Wafer probe

Number of patents in Portfolio can not be more than 2000

United States of America Patent

11975176

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PATENT NO	7495461
APP PUB NO	20080042678A1
SERIAL NO	11975176
DOCKET NO

US Family Size	Non-US Coverage
Patent Longevity Expired	Forward Citations

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
February 24, 2009	US,7495461,B2 US7495461B2	GRANTED PATENT AS SECOND PUBLICATION
February 21, 2008	US,20080042678,A1 US20080042678A1	FIRST PUBLISHED PATENT APPLICATION

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11975176

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