Three-dimensional measuring system
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United States of America Patent
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Feb 24, 2009
Grant Date -
Dec 28, 2006
app pub date -
Nov 8, 2005
filing date -
Jun 22, 2005
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A three-dimensional measuring system for measuring a three-dimensional shape of a measurement object in a noncontact manner includes a first obtaining portion for obtaining arrangement information of the measurement object, a second obtaining portion for obtaining design shape information of the measurement object, a fourth obtaining portion for obtaining specifics information about one or more three-dimensional measuring devices, a determining portion for determining a measurable part that can be measured by the three-dimensional measuring device about a surface shape of the measurement object in accordance with the obtained arrangement information, the obtained design shape information and the obtained specifics information, and an output portion for outputting the determined measurable part.
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