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• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

Patent Owner	Address	Total Patents
CASCADE MICROTECH, INC.	BEAVERTON, OR	137

International Classification(s)

• G01R:MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC V....

• [Classification Symbol]

• [Patents Count]

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Cowan, Clarence E	Newberg, US	28	511
Dunklee, John	Tigard, US	36	461

Cited Art Landscape

Patent Info	(Count)	# Cites	Year
Other [Check patent profile for assignment information] (32)
4,284,682 Heat sealable, flame and abrasion resistant coated fabric		125	1980
4,383,217 Collinear four-point probe head and mount for resistivity measurements		88	1981
4,480,223 Unitary probe assembly		136	1981
4,641,659 Medical diagnostic microwave scanning apparatus		112	1982
4,515,133 Fuel economizing device		77	1984
4,812,754 Circuit board interfacing apparatus		117	1987
4,711,563 Portable collapsible darkroom		90	1987
4,731,577 Coaxial probe card		120	1987
4,791,363 Ceramic microstrip probe blade		137	1987
5,363,050 Quantitative dielectric imaging system		112	1990
5,371,457 Method and apparatus to test for current in an integrated circuit		99	1991
5,209,088 Changeable code lock		66	1991
5,414,565 Tilting kinematic mount		85	1991
5,187,443 Microwave test fixtures for determining the dielectric properties of a material		80	1992
5,220,277 Arrangement for testing semiconductor wafers or the like		103	1992
5,584,608 Anchored cable sling system		86	1994
5,670,322 Multi site molecule detection method		179	1995
5,670,888 Method for transporting and testing wafers		128	1995
5,744,971 Device and apparatus for measuring dielectric properties of materials		96	1995
5,831,442 Handling device		96	1996
5,675,932 Plant growing system		92	1996
5,949,579 Flexible darkness adapting viewer		89	1997
6,147,851 Method for guarding electrical regions having potential gradients		92	1999
6,327,034 Apparatus for aligning two objects		93	1999
6,548,311 Device and method for detecting analytes		125	2000
2001/0002,794 Split resistor probe and method		79	2001
2002/0066,551 Workpiece chuck		25	2001
6,587,327 Integrated broadband ceramic capacitor array		115	2002
2003/0139,662 Method and apparatus for detecting, identifying and performing operations on microstructures including, anthrax spores, brain cells, cancer cells, living tissue cells, and macro-objects including stereotactic neurosurgery instruments, weapons and explosives		85	2002
7,015,707 Micro probe		118	2003
2004/0193,382 Method and apparatus for calibrating a multiport test system for measurement of a DUT		99	2004
2006/0114,012 Method and apparatus for testing semiconductor wafers by means of a probe card		47	2005
AUTOCYTE NORTH CAROLINA, L.L.C. (1)
5,659,421 Slide positioning and holding device		109	1995
GENERAL ELECTRIC MEDICAL SYSTEMS ISRAEL LTD., AN ISRAEL CORPORATION AFFILIATED WITH GENERAL ELECTRIC COMPANY (1)
4,691,163 Dual frequency surface probes		116	1985
John H. Blanz Company, Inc. (4)
5,097,207 Temperature stable cryogenic probe station		107	1989
5,077,523 Cryogenic probe station having movable chuck accomodating variable thickness probe cards		103	1990
5,160,883 Test station having vibrationally stabilized X, Y and Z movable integrated circuit receiving support		96	1990
5,166,606 High efficiency cryogenic test station		95	1990
DAINIPPON SCREEN MFG. CO., LTD. (3)
4,531,474 Rotary board treating apparatus		89	1984
4,746,857 Probing apparatus for measuring electrical characteristics of semiconductor device formed on wafer		96	1986
5,233,291 Method of and apparatus for measuring electric characteristics of semiconductor wafer		40	1991
SCIENCE & TECHNOLOGY CORPORATION @ UNM (1)
6,549,022 Apparatus and method for analyzing functional failures in integrated circuits		130	2000
XILINX, INC. (1)
6,512,482 Method and apparatus using a semiconductor die integrated antenna structure		93	2001
KDC TECHNOLOGY CORP. (1)
5,227,730 Microwave needle dielectric sensors		102	1992
Kraftwerk Union Aktiengesellschaft (1)
4,642,417 Concentric three-conductor cable		115	1985
SIERRA MONOLITHICS, INC. (1)
6,639,461 Ultra-wideband power amplifier module apparatus and method for optical and electronic communications		82	2001
SV PROBE PTE LTD. (2)
5,422,574 Large scale protrusion membrane for semiconductor devices under test with very high pin counts		180	1993
6,037,785 Probe card apparatus		109	1996
HUGHES ELECTRONICS CORPORATION (2)
4,772,846 Wafer alignment and positioning apparatus for chip testing by voltage contrast electron microscopy		139	1986
5,583,445 Opto-electronic membrane probe		102	1994
Sandia Corporation (1)
6,078,183 Thermally-induced voltage alteration for integrated circuit analysis		132	1998
ROSENBERGER HOCHFREQUENZTECHNIK GMBH & CO. KG (1)
2004/0066,181 High-frequency probe tip		82	2003
NORTHROP GRUMMAN CORPORATION (1)
2005/0026,276 Remote detection and analysis of chemical and biological aerosols		80	2003
BROADCOM CORPORATION (1)
7,088,981 Apparatus for reducing flicker noise in a mixer circuit		111	2001
LOCKHEED MARTIN CORPORATION (1)
4,853,613 Calibration method for apparatus evaluating microwave/millimeter wave circuits		66	1987
MAX-PLANCK-INSTITUT FÜR EISENFORSCHUNG GMBH (1)
5,369,370 Method and apparatus for the measurement of the corrosion potential between a coated metal surface and a reference electrode		70	1992
NEWPORT FAB, LLC (1)
6,727,716 Probe card and probe needle for high frequency testing		96	2002
PROFILE TECHNOLOGIES, INC. (1)
2001/0044,152 Dual beam, pulse propagation analyzer, medical profiler interferometer		73	2001
BARKER REVOCABLE TRUST U/A/D (1)
5,202,558 Flexible fiber optic probe for high-pressure shock experiments		103	1992
BRUKER NANO, INC. (2)
5,376,790 Scanning probe microscope		115	1992
5,672,816 Large stage system for scanning probe microscopes and other instruments		119	1995
NORTHROP GRUMMAN SYSTEMS CORPORATION (1)
5,479,109 Testing device for integrated circuits on wafer		118	1994
Nikon Corporation (2)
4,856,904 Wafer inspecting apparatus		115	1988
6,628,503 Gas cooled electrostatic pin chuck for vacuum applications		108	2001
HEWLETT-PACKARD COMPANY (1)
4,795,962 Floating driver circuit and a device for measuring impedances of electrical components		95	1987
HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. (3)
4,839,587 Test fixture for tab circuits and devices		147	1988
5,198,753 Integrated circuit test fixture and method		129	1990
5,198,758 Method and apparatus for complete functional testing of a complex signal path of a semiconductor chip		72	1991
EMImaging Ltd (2)
5,715,819 Microwave tomographic spectroscopy system and method		150	1994
6,490,471 Electromagnetical imaging and therapeutic (EMIT) systems		93	2001
SILICONIX INCORPORATED (1)
6,476,442 Pseudo-Schottky diode		101	1998
BLACKBERRY LIMITED (1)
6,794,950 Waveguide to microstrip transition		86	2001
HUGHES AIRCRAFT COMPANY (2)
5,512,835 Electrical probe and method for measuring gaps and other discontinuities in enclosures using electrical inductance for RF shielding assessment		74	1992
5,412,866 Method of making a cast elastomer/membrane test probe assembly		123	1993
ITT CORPORATION (1)
5,105,148 Replaceable tip test probe		58	1991
Santronics, Inc. (1)
7,030,599 Hand held voltage detection probe		101	2004
GENRAD, INC. (1)
5,861,743 Hybrid scanner for use in an improved MDA tester		49	1995
TSK AMERICA, INC. (1)
2001/0043,073 PROBER INTERFACE PLATE		74	1999
INTERSIL CORPORATION (1)
4,528,504 Pulsed linear integrated circuit tester		97	1982
INTERMEC IP CORP. (1)
6,236,223 Method and apparatus for wireless radio frequency testing of RFID integrated circuits		187	1999
Texas Instruments Incorporated (8)
4,888,550 Intelligent multiprobe tip		92	1983
5,103,169 Relayless interconnections in high performance signal paths		55	1989
5,070,297 Full wafer integrated circuit testing device		293	1990
5,159,752 Scanning electron microscope based parametric testing method and apparatus		119	1990
5,225,037 Method for fabrication of probe card for testing of semiconductor devices		216	1991
5,511,010 Method and apparatus of eliminating interference in an undersettled electrical signal		93	1994
6,292,760 Method and apparatus to measure non-coherent signals		93	1998
7,026,833 Multiple-chip probe and universal tester contact assemblage		101	2005
The United States of America as represented by the Secretary of the Navy (2)
4,479,690 Underwater splice for submarine coaxial cable		61	1982
5,091,732 Lightweight deployable antenna system		89	1990
SENSOR DIAGNOSTICS, INC. (1)
4,713,347 Measurement of ligand/anti-ligand interactions using bulk conductance		209	1985
OMNIPROBE, INC. (1)
6,420,722 Method for sample separation and lift-out with one cut		126	2001
TEKTRONIX, INC. (11)
4,739,259 Telescoping pin probe		100	1986
4,758,785 Pressure control apparatus for use in an integrated circuit testing station		117	1986
4,673,839 Piezoelectric pressure sensing apparatus for integrated circuit testing stations		124	1986
4,783,625 Wideband high impedance card mountable probe		95	1988
4,838,802 Low inductance ground lead		49	1988
4,923,407 Adjustable low inductance probe		76	1989
5,136,237 Double insulated floating high voltage test probe		106	1991
5,225,796 Coplanar transmission structure having spurious mode suppression		61	1992
5,412,330 Optical module for an optically based measurement system		95	1993
6,447,339 Adapter for a multi-channel signal probe		87	2001
6,701,265 Calibration for vector network analyzer		94	2002
Yamaichi Denki Kogyo Kabushiki Kaisha (1)
4,978,914 Laminated board for testing electronic components		64	1990
Micron Technology, Inc. (10)
5,461,328 Fixture for burn-in testing of semiconductor wafers		94	1993
5,838,161 Semiconductor interconnect having test structures for evaluating electrical characteristics of the interconnect		87	1996
6,060,891 Probe card for semiconductor wafers and method and system for testing wafers		152	1997
6,181,144 Semiconductor probe card having resistance measuring circuitry and method fabrication		170	1998
6,194,720 Preparation of transmission electron microscope samples		110	1998
6,229,322 Electronic device workpiece processing apparatus and method of communicating signals within an electronic device workpiece processing apparatus		32	1998
6,774,651 Method for aligning and connecting semiconductor components to substrates		68	2000
6,359,456 Probe card and test system for semiconductor wafers		115	2001
7,026,835 Engagement probe having a grouping of projecting apexes for engaging a conductive pad		93	2002
7,009,188 Lift-out probe having an extension tip, methods of making and using, and analytical instruments employing same		97	2004
XEROX CORPORATION (1)
4,780,670 Active probe card for high resolution/low noise wafer level testing		135	1985
SEIKO INSTRUMENTS INC. (1)
7,015,455 Near-field optical probe		93	2005
HAMAMATSU PHOTONICS K.K. (2)
4,922,186 Voltage detector		82	1988
5,552,716 Method of positioning an electrooptic probe of an apparatus for the measurement of voltage		51	1994
ANDO ELECTRIC CO., LTD. (1)
2001/0054,906 Probe card and a method of manufacturing the same		78	2001
SILICON VALLEY BANK (5)
4,893,914 Test station		112	1988
5,892,539 Portable emission microscope workstation for failure analysis		126	1995
6,198,299 High Resolution analytical probe station		85	1998
6,424,141 Wafer probe station		61	2000
6,744,268 High resolution analytical probe station		123	2002
YOKOWO CO., LTD. (4)
7,019,701 Antenna device mounted on vehicle		85	2004
6,900,647 Contact probe and probe device		105	2004
6,903,563 Contact probe and probe device		100	2004
7,015,710 Contact probe and probe device		97	2004
DELAWARE CAPITAL FORMATION, INC. (3)
5,408,189 Test fixture alignment system for printed circuit boards		148	1992
6,181,149 Grid array package test contactor		104	1996
6,064,218 Peripherally leaded package test contactor		105	1997
THOMAS JEFFERSON UNIVERSITY (1)
5,478,748 Protein assay using microwave energy		89	1994
TRW INC. (1)
4,468,629 NPN Operational amplifier		79	1982
HEIDELBERGER DRUCKMASCHINEN AG (1)
4,856,426 Sheet-fed rotary printing machine with printing units arranged in tandem		55	1985
AMP INCORPORATED, A CORPORATION OF PENNSYLVANIA (1)
4,777,434 Microelectronic burn-in system		87	1987
MDS INC. (5)
6,376,258 Resonant bio-assay device and test system for detecting molecular binding events		137	2000
6,340,568 Method for detecting and classifying nucleic acid hybridization		84	2001
6,566,079 Methods for analyzing protein binding events		102	2001
2003/0032,000 Method for analyzing cellular events		93	2001
2002/0168,659 System and method for characterizing the permittivity of molecular events		75	2002
CREDENCE SYSTEMS CORPORATION (1)
5,883,523 Coherent switching power for an analog circuit tester		105	1997
MITSUBISHI GAS CHEMICAL COMPANY, INC. (1)
6,222,031 Process for preparing water-soluble tricarboxypolysaccharide		83	1998
SHARP KABUSHIKI KAISHA (2)
5,089,774 Apparatus and a method for checking a semiconductor		129	1990
5,374,938 Waveguide to microstrip conversion means in a satellite broadcasting adaptor		95	1993
SYMBOL TECHNOLOGIES, LLC (1)
6,002,236 Lockable storage cradle for battery-operated electronic device		55	1998
IBIDEN CO., LTD. (3)
2004/0021,475 Wafer prober		82	2003
2004/0134,899 Ceramic substrate for a semiconductor-production/inspection device		80	2003
2004/0207,072 Ceramic substrate for a semiconductor producing/examining device		85	2004
MEDISPECTRA, INC. (1)
2004/0186,382 Spectral volume microprobe arrays		83	2003
TELEFONAKTIEBOLAGET L M ERICSSON (PUBL) (1)
5,996,102 Assembly and method for testing integrated circuit devices		90	1997
SILICON GRAPHICS, INC. (1)
4,982,153 Method and apparatus for cooling an integrated circuit chip during testing		63	1989
SANTA BARBARA RESEARCH CENTER (2)
4,695,794 Voltage calibration in E-beam probe using optical flooding		61	1985
4,730,158 Electron-beam probing of photodiodes		85	1986
CERPROBE CORPORATION (1)
6,002,426 Inverted alignment station and method for calibrating needles of probe card for probe testing of integrated circuits		113	1997
DRANETZ TECHNOLOGIES, INC., (1)
4,414,638 Sampling network analyzer with stored correction of gain errors		74	1981
GLUCOSET AS (1)
7,003,184 Fiber optic probes		109	2001
EADS DEUTSCHLAND GMBH (1)
6,636,182 Structural antenna for flight aggregates or aircraft		74	2001
University of Massachusetts (1)
5,233,197 High speed digital imaging microscope		112	1991
RPX CLEARINGHOUSE LLC (1)
6,753,679 Test point monitor using embedded passive resistance		84	2002
UNIVERSITY OF MARYLAND, BALTIMORE (1)
6,809,533 Quantitative imaging of dielectric permittivity and tunability		79	2002
The Boeing Company (1)
4,727,637 Computer aided connector assembly method and apparatus		114	1987
Fujikura Rubber Works, Ltd. (1)
4,425,395 Base fabrics for polyurethane-coated fabrics, polyurethane-coated fabrics and processes for their production		105	1982
FUJIKURA LTD. (1)
4,626,618 DC electric power cable		99	1985
RELIABILITY INCORPORATED (1)
2002/0070,745 Cooling system for burn-in unit		85	2000
FILOTEX (1)
5,397,855 Low noise cable		95	1993
AGILENT TECHNOLOGIES, INC. (30)
4,588,970 Three section termination for an R.F. triaxial directional bridge		51	1984
4,703,433 Vector network analyzer with integral processor		111	1984
4,816,767 Vector network analyzer with integral processor		106	1986
4,771,234 Vacuum actuated test fixture		105	1986
4,918,383 Membrane probe with automatic contact scrub action		156	1988
4,906,920 Self-leveling membrane probe		204	1988
5,172,051 Wide bandwidth passive probe		110	1991
5,298,972 Method and apparatus for measuring polarization sensitivity of optical devices		111	1991
5,274,336 Capacitively-coupled test probe		139	1992
5,680,039 Probe apparatus for use in both high and low frequency measurements		48	1995
5,578,932 Method and apparatus for providing and calibrating a multiport network analyzer		147	1995
5,945,836 Loaded-board, guided-probe test fixture		130	1996
5,923,177 Portable wedge probe for perusing signals on the pins of an IC		49	1997
5,903,143 Probe apparatus with RC circuit connected between ground and a guard		94	1997
6,060,888 Error correction method for reflection measurements of reciprocal devices in vector network analyzers		113	1998
6,251,595 Methods and devices for carrying out chemical reactions		120	1998
6,175,228 Electronic probe for measuring high impedance tri-state logic circuits		84	1998
6,271,673 Probe for measuring signals		105	1999
6,407,562 Probe tip terminating device providing an easily changeable feed-through termination		95	1999
2001/0024,116 Electronic probe for measuring high impedance tri-state logic circuits		79	2001
6,643,597 Calibrating a test system using unknown standards		118	2001
6,717,426 Blade-like connecting needle		79	2002
6,768,328 Single point probe structure and method		75	2002
6,873,167 Connection box, system, and method for evaluating a DUT board		52	2002
6,864,694 Voltage probe		91	2002
2005/0030,047 Method and apparatus for measuring a device under test using an improved through-reflect-line measurement calibration		86	2003
7,025,628 Electronic probe extender		113	2003
2004/0162,689 Multiport network analyzer calibration employing reciprocity of a device		95	2004
7,005,868 Apparatus and method for canceling DC errors and noise generated by ground shield current in a probe		93	2004
7,026,834 Multiple two axis floating probe block assembly using split probe block		93	2005
ROSEMOUNT TANK RADAR AB (1)
6,278,411 Horn antenna		80	1999
The Aerospace Corporation (2)
6,211,663 Baseband time-domain waveform measurement method		117	1999
6,396,298 Active feedback pulsed measurement method		91	2000
ORGANISATION EUROPEENNE POUR LA RECHERCHE NUCLEAIRE (1)
4,933,634 Device and method to measure a short radiation pulse or an electric pulse		66	1989
Acome, Societies Anonyme (1)
4,621,169 Electric cable construction and uses therefor		94	1985
DESIGNTECH INTERNATIONAL, INC. (1)
5,041,782 Microstrip probe		96	1989
Gebr. Marzhauser Wetzlar oHG (1)
4,552,033 Drive system for a microscope stage or the like		110	1984
L&P PROPERTY MANAGEMENT COMPANY (1)
5,505,150 Method and apparatus for facilitating loop take time adjustment in multi-needle quilting machine		87	1994
DH TECHNOLOGIES DEVELOPMENT PTE. LTD. (1)
6,627,461 Method and apparatus for detection of molecular events using temperature control of detection environment		97	2001
FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG E.V. (1)
6,653,903 Supply voltage decoupling device for HF amplifier circuits		73	2001
Bendix Electronics S.A. (1)
4,884,206 Process and processing circuit for the analog output signal of a sensor		55	1988
PRECISION DIVERSIFIED INDUSTRIES, INC. (1)
4,694,245 Vacuum-actuated top access test probe fixture		75	1984
MEASUREMENT SYSTEMS, INC. (1)
5,646,538 Method and apparatus for fastener hole inspection with a capacitive probe		53	1995
NORTH STAR INNOVATIONS INC. (1)
6,127,831 Method of testing a semiconductor device by automatically measuring probe tip parameters		105	1997
KLA-TENCOR CORPORATION (2)
6,633,174 Stepper type test structures and methods for inspection of semiconductor integrated circuits		101	2000
6,771,806 Multi-pixel methods and apparatus for analysis of defect information from test structures on semiconductor devices		143	2000
Takeda Riken Co., Ltd. (1)
4,691,831 IC test equipment		53	1985
Mattson Technology, Inc. (1)
6,172,337 System and method for thermal processing of a semiconductor substrate		105	1999
EJ SYSTEMS, INC. (1)
5,164,661 Thermal control system for a semi-conductor burn-in		93	1991
ELECTRO SCIENTIFIC INDUSTRIES, INC. (1)
6,100,815 Compound switching matrix for probing and interconnecting devices under test to measurement equipment		114	1997
Infrared Laboratories, Inc. (1)
6,515,494 Silicon wafer probe station using back-side imaging		42	2000
EUROPEAN ELECTRONIC TEST CENTRE (1)
5,006,796 Temperature control instrument for electronic components under test		87	1988
HYNIX SEMICONDUCTOR INC. (1)
7,002,364 Semiconductor device for reducing the number of probing pad used during wafer test and method for testing the same		96	2003
TRANSAT CORPORATION (1)
5,451,884 Electronic component temperature test system with flat ring revolving carriage		102	1993
RYODEN SEMICONDUCTOR SYSTEM ENGINEERING CORPORATION (1)
6,194,907 Prober and electric evaluation method of semiconductor device		61	1999
Canon Kabushiki Kaisha (8)
4,503,335 Semiconductor printing apparatus with multiple independent temperature control		112	1982
4,755,747 Wafer prober and a probe card to be used therewith		109	1985
4,786,867 Wafer prober		106	1987
4,864,227 Wafer prober		132	1988
4,929,893 Wafer prober		160	1988
5,304,924 Edge detector		99	1992
5,731,920 Converting adapter for interchangeable lens assembly		95	1995
5,685,232 Positioning stage device exposure apparatus and device manufacturing method utilizing the same		116	1996
SYM-TEK INCORPORATED OF MINNESOTA (1)
4,926,118 Test station		120	1988
CHENG, DAVID (1)
5,479,108 Method and apparatus for handling wafers		158	1992
ENDEVCO CORPORATION (1)
5,214,243 High-temperature, low-noise coaxial cable assembly with high strength reinforcement braid		128	1991
Tovex Tech, Inc. (1)
5,065,089 Circuit handler with sectioned rail		56	1990
LUCENT TECHNOLOGIES INC. (2)
5,970,429 Method and apparatus for measuring electrical noise in devices		130	1997
6,245,692 Method to selectively heat semiconductor wafers		91	1999
VEECO METROLOGY INC. (1)
7,001,785 Capacitance probe for thin dielectric film characterization		100	2004
ALPS ELECTRIC CO., LTD. (1)
4,725,793 Waveguide-microstrip line converter		87	1986
Nebraska Electronics, Inc. (1)
5,481,196 Process and apparatus for microwave diagnostics and therapy		85	1994
Cornell Research Foundation, Inc. (1)
4,680,538 Millimeter wave vector network analyzer		72	1985
Yugen Kaisha Sozoan (1)
5,481,936 Rotary drive positioning system for an indexing table		114	1994
TELEDYNE LECROY, INC. (2)
6,822,463 Active differential test probe with a transmission line input structure		77	2002
7,019,544 Transmission line input structure test probe		96	2004
DYNEX SEMICONDUCTOR LIMITED (1)
6,265,950 Transition from a waveguide to a strip transmission line		92	1999
H+W Test Products, Inc. (1)
6,054,869 Bi-level test fixture for testing printed circuit boards		97	1998
MURATA MANUFACTURING CO., LTD. (1)
6,838,885 Method of correcting measurement error and electronic component characteristic measurement apparatus		101	2003
MOTOROLA, INC. (3)
4,453,142 Microstrip to waveguide transition		112	1981
4,646,005 Signal probe		100	1984
5,748,506 Calibration technique for a network analyzer		95	1996
GEO INTERNATIONAL CORPORATION (1)
4,675,600 Testing apparatus for plated through-holes on printed circuit boards, and probe therefor		65	1984
M/A-COM TECHNOLOGY SOLUTIONS HOLDINGS, INC. (1)
5,142,224 Non-destructive semiconductor wafer probing system using laser pulses to generate and detect millimeter wave signals		104	1991
M/A-COM, INC. (1)
4,376,920 Shielded radio frequency transmission cable		142	1981
INTEL CORPORATION (4)
5,944,093 Pickup chuck with an integral heat pipe		103	1997
7,020,363 Optical probe for wafer testing		99	2001
6,856,129 Current probe device having an integrated amplifier		92	2002
2006/0052,075 Testing integrated circuits using high bandwidth wireless technology		77	2004
MITSUBISHI DENKI KABUSHIKI KAISHA (7)
4,431,967 Method of mounting a semiconductor element for analyzing failures thereon		29	1980
5,010,296 Wafer prober		62	1990
5,408,188 High frequency wafer probe including open end waveguide		77	1992
5,493,236 Test analysis apparatus and analysis method for semiconductor wafer using OBIC analysis		189	1994
6,144,212 Vertical needle type probe card, method of manufacturing thereof, method of replacing defective probe needle and test method of wafer using the probe card		108	1998
6,242,929 Probe needle for vertical needle type probe card and fabrication thereof		89	1998
6,404,213 Probe stylus		85	1999
STMICROELECTRONICS SA (1)
6,480,013 Method for the calibration of an RF integrated circuit probe		101	2000
SIGNATURE BIOSCIENCESM INC. (1)
6,395,480 Computer program and database structure for detecting molecular binding events		108	1999
ST. CLAIR INTELLECTUAL PROPERTY CONSULTANTS, INC. (1)
4,904,933 Integrated circuit probe station		114	1986
GGB INDUSTRIES, INC. (3)
5,373,231 Integrated circuit probing apparatus including a capacitor bypass structure		126	1993
6,603,322 Probe card for high speed testing		102	1996
6,118,287 Probe tip structure		103	1997
TDK RF SOLUTIONS, INC. (1)
6,657,601 Metrology antenna system utilizing two-port, sleeve dipole and non-radiating balancing network		77	2001
WI-LAN INC. (2)
5,565,881 Balun apparatus including impedance transformer having transformation length		84	1994
5,628,057 Multi-port radio frequency signal transformation network		100	1996
ARRAY BIOSCIENCE CORPORATION (1)
6,707,548 Systems and methods for filter based spectrographic analysis		109	2001
AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD. (3)
6,927,079 Method for probing a semiconductor wafer		105	2000
6,605,951 Interconnector and method of connecting probes to a die for functional analysis		108	2000
7,023,225 Wafer-mounted micro-probing platform		94	2003
HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP (2)
6,233,613 High impedance probe for monitoring fast ethernet LAN links		97	1997
7,002,133 Detecting one or more photons from their interactions with probe photons in a matter system		93	2003
AVAGO TECHNOLOGIES ECBU IP (SINGAPORE) PTE. LTD. (1)
5,066,357 Method for making flexible circuit card with laser-contoured vias and machined capacitors		108	1990
Xandex, Inc. (3)
5,528,158 Probe card changer system and method		105	1994
5,506,498 Probe card system and method		98	1995
6,166,553 Prober-tester electrical interface for semiconductor test		99	1998
BENHOV GMBH, LLC (1)
6,418,009 Broadband multi-layer capacitor		88	2000
TDK CORPORATION (2)
5,510,792 Anechoic chamber and wave absorber		95	1994
7,012,425 Eddy-current probe		95	2005
THOMSON-CSF (1)
4,742,571 Coupling device between a metal wave guide, a dielectric wave guide and a semiconductor component and a mixer using this coupling device		87	1986
ETS Gourdon (1)
5,034,688 Temperature conditioning support for small objects such as semi-conductor components and thermal regulation process using said support		143	1989
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE (2)
6,049,216 Contact type prober automatic alignment		93	1997
7,012,441 High conducting thin-film nanoprobe card and its fabrication method		106	2003
GENERAL SIGNAL CORPORATION (1)
4,557,599 Calibration and alignment target plate		85	1984
KEITHLEY INSTRUMENTS, INC. (2)
6,121,783 Method and apparatus for establishing electrical contact between a wafer and a chuck		92	1997
6,104,206 Product wafer junction leakage measurement using corona and a kelvin probe		126	1997
MASSACHUSETTS INSTITUTE OF TECHNOLOGY (2)
5,653,939 Optical and electrical methods and apparatus for molecule detection		473	1995
5,998,768 Active thermal control of surfaces by steering heating beam in response to sensed thermal radiation		107	1998
NEC CORPORATION (3)
6,310,483 Longitudinal type high frequency probe for narrow pitched electrodes		103	1998
6,281,691 Tip portion structure of high-frequency probe and method for fabrication probe tip portion composed by coaxial cable		103	1999
6,400,168 Method for fabricating probe tip portion composed by coaxial cable		104	2001
CSI TECHNOLOGY, INC. (1)
6,091,236 System and method for measuring and analyzing electrical signals on the shaft of a machine		97	1997
ADVANCED RESEARCH AND APPLICATIONS CORPORATION (1)
4,575,676 Method and apparatus for radiation testing of electron devices		75	1983
ELK FINANCIAL, INC. (2)
6,064,217 Fine pitch contact device employing a compliant conductive polymer bump		134	1996
2002/0011,859 METHOD FOR FORMING CONDUCTIVE BUMPS FOR THE PURPOSE OF CONTRRUCTING A FINE PITCH TEST DEVICE		113	1998
Tokyo Ohka Kogyo Co., Ltd. (1)
5,571,324 Rotary-cup coating apparatus		104	1994
SMSC ANALOG TECHNOLOGY, INC. (1)
6,753,699 Integrated circuit and method of controlling output impedance		81	2002
MTU MOTOREN- UND TURBINEN-UNION MUENCHEN GMBH (1)
5,232,789 Structural component with a protective coating having a nickel or cobalt basis and method for making such a coating		92	1992
Hypervision, Inc. (1)
5,475,316 Transportable image emission microscope		140	1993
ADVANTEST CORPORATION (8)
5,172,049 IC test equipment		131	1991
5,644,248 Test head cooling system		84	1995
5,767,690 Test head cooling system		92	1997
5,952,842 Test head cooling system		59	1997
6,191,596 Method for detecting a contact position between an object to be measured and measuring pins		81	1998
6,257,319 IC testing apparatus		61	1999
2002/0011,863 IC chip tester with heating element for preventing condensation		88	2001
7,020,360 Wavelength dispersion probing system		94	2002
PHASE METRICS (2)
5,517,111 Automatic testing system for magnetoresistive heads		65	1995
5,668,470 Automatic testing system for magnetoresistive heads		56	1996
NEC ELECTRONICS CORPORATION (1)
6,320,396 Parasitic MIM structural spot analysis method for semiconductor device and parasitic MIM structure spot analysis method for silicon semiconductor device		99	1997
FM INDUSTRIES, INC. (1)
5,572,398 Tri-polar electrostatic chuck		80	1994
PINNACLE PRODUCTS, INC. (1)
5,807,107 Dental infection control system		94	1996
ATG ELECTRONICS, INC. (1)
5,198,756 Test fixture wiring integrity verification device		153	1991
Technoprobe S.r.l. (1)
2002/0070,743 Testing head having vertical probes		95	2001
Tokyo Shibaura Denki Kabushiki Kaisha (1)
4,532,423 IC Tester using an electron beam capable of easily setting a probe card unit for wafers & packaged IC's to be tested		105	1983
ANRITSU COMPANY (3)
5,905,421 Apparatus for measuring and/or injecting high frequency signals in integrated systems		80	1997
6,169,410 Wafer probe with built in RF frequency conversion module		85	1998
6,529,844 Vector network measurement system		116	1999
THERMOCARBON, INC. (1)
5,676,360 Machine tool rotary table locking apparatus		116	1995
Data Probe Corporation (1)
4,588,950 Test system for VLSI digital circuit and method of testing		97	1983
MOLECULAR DEVICES, INC. (1)
5,164,319 Multiple chemically modulated capacitance determination		324	1989
MITEL CORPORATION (1)
5,508,631 Semiconductor test chip with on wafer switching matrix		55	1994
HONEYWELL INC. (1)
6,232,790 Method and apparatus for amplifying electrical test signals from a micromechanical device		66	1999
MILLER DESIGN AND EQUIPMENT INC. (1)
5,303,938 Kelvin chuck apparatus and method of manufacture		59	1993
Honeywell Information Systems Inc. (1)
4,342,958 Automatic test equipment test probe contact isolation detection method		72	1980
MicroCraft (1)
7,188,037 Method and apparatus for testing circuit boards		84	2004
BECHTEL BWXT IDAHO, LLC (1)
6,147,502 Method and apparatus for measuring butterfat and protein content using microwave absorption techniques		80	1998
KAI Technologies, Inc. (1)
6,275,738 Microwave devices for medical hyperthermia, thermotherapy and diagnosis		140	1999
Charmilles Technologies SA (1)
4,918,279 EDM cutting machine including device for preventing transmission of sealing plate movement to guide head arm		60	1988
UNIVERSITY OF SOUTH FLORIDA (1)
5,835,997 Wafer shielding chamber for probe station		60	1995
FLUKE CORPORATION (1)
6,384,614 Single tip Kelvin probe		103	2000
Junkosha Co., Ltd. (1)
4,567,321 Flexible flat cable		102	1984
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. (3)
5,594,358 Radio frequency probe and probe card including a signal needle and grounding needle coupled to a microstrip transmission line		98	1994
5,794,133 Microwave mixing circuit		84	1996
6,806,836 Helical antenna apparatus provided with two helical antenna elements, and radio communication apparatus provided with same helical antenna apparatus		75	2003
INTEGRATED TECHNOLOGY CORPORATION (2)
5,657,394 Integrated circuit probe card inspection system		93	1993
6,118,894 Integrated circuit probe card inspection system		118	1997
UNIVERSITY OF WALES, ABERYSTWYTH (1)
5,569,591 Analytical or monitoring apparatus and method		153	1994
SOLID STATE MEASUREMENTS, INC. (2)
6,900,652 Flexible membrane probe and method of use thereof		106	2003
7,023,231 Work function controlled probe for measuring properties of a semiconductor wafer and method of use thereof		94	2004
Solid State Farms, Inc. (1)
5,792,668 Radio frequency spectral analysis for in-vitro or in-vivo environments		209	1996
SONY CORPORATION (2)
6,362,792 Antenna apparatus and portable radio set		78	2000
6,366,247 Antenna device and portable radio set		83	2000
New Wave Research (4)
5,611,946 Multi-wavelength laser system, probe station and laser cutter system using the same		94	1994
5,811,751 Multi-wavelength laser system, probe station and laser cutter system using the same		141	1997
6,573,702 Method and apparatus for cleaning electronic test contacts		103	1997
5,963,364 Multi-wavelength variable attenuator and half wave plate		120	1997
Spectroscopy Imaging Systems Corporation (1)
4,916,398 Efficient remote transmission line probe tuning for NMR apparatus		95	1988
WENTWORTH LABORATORIES, INC. (3)
5,959,461 Probe station adapter for backside emission inspection		122	1997
* 6,031,383 Probe station for low current, low voltage parametric measurements using multiple probes		107	1998
6,124,723 Probe holder for low voltage, low current measurements in a water probe station		83	1998
FormFactor, Inc. (3)
5,974,662 Method of planarizing tips of probe elements of a probe card assembly		369	1995
6,064,213 Wafer-level burn-in and test		264	1997
7,002,363 Method and system for compensating thermally induced motion of probe cards		120	2001
SAMSUNG ELECTRONICS CO., LTD. (2)
6,970,001 Variable impedance test probe		74	2003
6,900,653 Needle fixture of a probe card in semiconductor inspection equipment and needle fixing method thereof		106	2003
Sony Electronics Inc. (5)
5,669,316 Turntable for rotating a wafer carrier		101	1993
6,043,668 Planarity verification system for integrated circuit test probes		54	1997
6,137,303 Integrated testing method and apparatus for semiconductor test operations processing		124	1998
6,259,261 Method and apparatus for electrically testing semiconductor devices fabricated on a wafer		67	1999
2007/0024,506 Systems and methods for high frequency parallel transmissions		79	2006
WISCONSIN ALUMNI RESEARCH FOUNDATION (1)
2003/0088,180 Space-time microwave imaging for cancer detection		114	2002
SEMITEST, INC. (2)
4,891,584 Apparatus for making surface photovoltage measurements of a semiconductor		138	1988
5,091,691 Apparatus for making surface photovoltage measurements of a semiconductor		81	1988
BOARD OF REGENTS, THE UNIVERSITY OF TEXAS SYSTEM (1)
2003/0119,057 Forming and modifying dielectrically-engineered microparticles		131	2001
OXFORD INSTRUMENTS AMERICA, INC. (1)
5,448,172 Triboelectric instrument with DC drift compensation		40	1993
NXP B.V. (1)
5,491,426 Adaptable wafer probe assembly for testing ICs with different power/ground bond pad configurations		79	1994
CONTRAVES AG (1)
4,567,908 Discharge system and method of operating same		50	1984
RENESAS ELECTRONICS CORPORATION (4)
6,028,435 Semiconductor device evaluation system using optical fiber		108	1997
6,160,407 Inspection method and wiring current observation method for semiconductor device and apparatus of the same		98	1998
6,686,753 Prober and apparatus for semiconductor chip analysis		54	2000
6,900,646 Probing device and manufacturing method thereof, as well as testing apparatus and manufacturing method of semiconductor with use thereof		97	2002
KABUSHIKI KAISHA NIHON MICRONICS (2)
5,888,075 Auxiliary apparatus for testing device		78	1997
6,019,612 Electrical connecting apparatus for electrically connecting a device to be tested		87	1998
SAMSUNG AEROSPACE INDUSTRIES, LTD. (1)
5,857,667 Vacuum chuck		68	1996
DIT-MCO INTERNATIONAL CORPORATION (1)
4,357,575 Apparatus for use in testing printed circuit process boards having means for positioning such boards in proper juxtaposition with electrical contacting assemblies		116	1980
MCC GESELLSCHAFT FUR DIAGNOSESYSTEME IN MEDIZIN UND TECHNIK MBH & CO. KG (1)
2005/0168,722 Device and method for measuring constituents in blood		40	2003
OPTOMETRIX, INC. (1)
6,181,416 Schlieren method for imaging semiconductor device properties		84	1999
SEMICONDUCTOR PHYSICS LABORATORY, INC. (1)
6,052,653 Spreading resistance profiling system		100	1997
TERADYNE, INC. (1)
6,784,679 Differential coaxial contact array for high-density, high-speed signals		93	2002
GLOBALFOUNDRIES INC. (10)
6,091,255 System and method for tasking processing modules based upon temperature		134	1998
6,608,494 Single point high resolution time resolved photoemission microscopy system and method		111	1998
6,483,327 Quadrant avalanche photodiode time-resolved detection		109	1999
6,724,928 Real-time photoemission detection system		97	2000
6,488,405 Flip chip defect analysis using liquid crystal		101	2000
6,617,862 Laser intrusive technique for locating specific integrated circuit current paths		98	2002
6,788,093 Methodology and apparatus using real-time optical signal for wafer-level device dielectrical reliability studies		107	2002
7,022,976 Dynamically adjustable probe tips		98	2003
7,011,531 Membrane probe with anchored elements		93	2005
7,005,879 Device for probe card power bus noise reduction		93	2005
ENDWAVE CORPORATION (1)
6,023,209 Coplanar microwave circuit having suppression of undesired modes		77	1996
Microwave Imaging Systems Technologies, Inc. (2)
5,841,288 Two-dimensional microwave imaging apparatus and methods		123	1997
6,448,788 Fixed array microwave imaging apparatus and method		110	2000
CASCADE MICROTECH, INC. (62)
4,697,143 Wafer probe		200	1984
4,827,211 Wafer probe		127	1987
4,858,160 System for setting reference reactance for vector corrected measurements		99	1988
4,849,689 Microwave wafer probe having replaceable probe tip		128	1988
4,994,737 System for facilitating planar probe measurements of high-speed interconnect structures		57	1990
5,045,781 High-frequency active probe having replaceable contact needles		110	1991
5,101,453 Fiber optic wafer probe		102	1991
5,237,267 Wafer probe station having auxiliary chucks		52	1992
5,266,889 Wafer probe station with integrated environment control enclosure		135	1992
5,345,170 Wafer probe station having integrated guarding, Kelvin connection and shielding systems		116	1992
5,457,398 Wafer probe station having full guarding		123	1993
5,434,512 Wafer probe station having integrated guarding, Kelvin connection and shielding systems		59	1994
5,506,515 High-frequency probe tip assembly		160	1994
5,532,609 Wafer probe station having environment control enclosure		70	1995
5,561,377 System for evaluating probing networks		65	1995
5,610,529 Probe station having conductive coating added to thermal chuck insulator		138	1995
5,565,788 Coaxial wafer probe with tip shielding		148	1995
5,663,653 Wafer probe station for low-current measurements		73	1995
5,729,150 Low-current probe card with reduced triboelectric current generating cables		137	1995
5,604,444 Wafer probe station having environment control enclosure		62	1996
5,659,255 Method of evaluating signal conditions in a probe measurement network having a plurality of separate measurement channels		58	1996
6,313,649 Wafer probe station having environment control enclosure		57	1997
6,232,788 Wafer probe station for low-current measurements		88	1997
6,232,789 Probe holder for low current measurements		87	1997
5,869,975 System for evaluating probing networks that have multiple probing ends		56	1997
5,963,027 Probe station having environment control chambers with orthogonally flexible lateral wall assembly		71	1997
6,002,263 Probe station having inner and outer shielding		60	1997
6,034,533 Low-current pogo probe card		111	1997
6,137,302 Low-current probe card with reduced triboelectric current generating cables		112	1997
5,973,505 System for evaluating probing networks		54	1998
6,445,202 Probe station thermal chuck with shielding for capacitive current		50	1999
6,252,392 Probe station having environment control chamber with bendably extensible and retractable lateral wall assembly		51	1999
6,130,544 System for evaluating probing networks		51	1999
6,288,557 Probe station having inner and outer shielding		51	1999
6,578,264 Method for constructing a membrane probe using a depression		79	2000
6,483,336 Indexing rotatable chuck for a probe station		53	2000
6,608,496 Reference transmission line junction for probing device		56	2000
6,335,628 Wafer probe station for low-current measurements		54	2001
6,380,751 Wafer probe station having environment control enclosure		49	2001
6,362,636 Probe station having multiple enclosures		53	2001
6,549,106 Waveguide with adjustable backshort		114	2001
6,492,822 Wafer probe station for low-current measurements		50	2001
6,489,789 Probe station having multiple enclosures		50	2001
6,486,687 Wafer probe station having environment control enclosure		51	2002
6,771,090 Indexing rotatable chuck for a probe station		56	2002
6,836,135 Optical testing device		51	2002
6,636,059 Wafer probe station having environment control enclosure		49	2002
6,639,415 Probe station having multiple enclosures		49	2002
6,720,782 Wafer probe station for low-current measurements		47	2002
6,777,964 Probe station		52	2002
6,724,205 Probe for combined signals		98	2002
6,642,732 Probe station thermal chuck with shielding for capacitive current		48	2002
6,861,856 Guarded tub enclosure		50	2002
6,801,047 Wafer probe station having environment control enclosure		47	2003
6,842,024 Probe station having multiple enclosures		47	2003
6,847,219 Probe station with low noise characteristics		61	2003
* 7,250,779 Probe station with low inductance path		24	2003
6,806,724 Probe for combined signals		95	2003
* 7,221,172 Switched suspended conductor and connection		23	2004
6,885,197 Indexing rotatable chuck for a probe station		47	2004
7,009,383 Wafer probe station having environment control enclosure		93	2004
7,187,188 Chuck with integrated wafer support		78	2004
HYPRES, INC. (1)
4,894,612 Soft probe for providing high speed on-wafer connections to a circuit		158	1988
National Semiconductor Corporation (4)
4,757,255 Environmental box for automated wafer probing		193	1986
5,101,149 Modifiable IC board		72	1989
5,883,522 Apparatus and method for retaining a semiconductor wafer during testing		107	1996
7,096,133 Method of establishing benchmark for figure of merit indicative of amplifier flicker noise		73	2005
ELECTRIC POWER RESEARCH INSTITUTE, INC. (1)
4,487,996 Shielded electrical cable		106	1982
DELPHI TECHNOLOGIES, INC. (1)
7,015,709 Ultra-broadband differential voltage probes		102	2004
MERCK & CO., INC. (1)
7,013,221 Iterative probe design and detailed expression profiling with flexible in-situ synthesis arrays		95	2000
SARANTEL LIMITED (3)
6,184,845 Dielectric-loaded antenna		138	1997
6,369,776 Antenna		92	1999
6,914,580 Dielectrically-loaded antenna		83	2003
XCERRA CORPORATION (1)
7,015,711 Apparatus and method for the testing of circuit boards, and test probe for this apparatus and this method		105	2004
MARTEK, INC. (3)
5,656,942 Prober and tester with contact interface for integrated circuits-containing wafer held docked in a vertical plane		111	1995
6,096,567 Method and apparatus for direct probe sensing		145	1997
6,320,372 Apparatus and method for testing a substrate having a plurality of terminals		101	1999
INTEGRATED PROCESS EQUIPMENT CORP. (1)
5,515,167 Transparent optical chuck incorporating optical monitoring		146	1994
NORTEL NETWORKS LIMITED (1)
4,853,624 Tunable microwave wafer probe		93	1988
Active Precision, Inc. (2)
6,756,751 Multiple degree of freedom substrate manipulator		36	2002
2003/0156,270 Multiple degree of freedom substrate manipulator		35	2002
ABBOTT DIABETES CARE INC. (1)
2005/0165,316 Method for detecting artifacts in data		77	2004
GCB INDUSTRIES, INC. (1)
6,229,327 Broadband impedance matching probe		111	1997
VEGA GRIESHABER KG (1)
7,030,827 Planar antenna and antenna system		74	2004
PURDUE RESEARCH FOUNDATION (1)
2004/0147,034 Method and apparatus for measuring a substance in a biological sample		135	2003
INTEST CORPORATION (1)
5,900,737 Method and apparatus for automated docking of a test head to a device handler		116	1996
GTE Valeron Corporation (1)
4,401,945 Apparatus for detecting the position of a probe relative to a workpiece		97	1981
INTEST IP CORPORATION (1)
4,705,447 Electronic test head positioner for test systems		135	1985
KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY (1)
6,528,993 Magneto-optical microscope magnetometer		80	2000
AMAZON TECHNOLOGIES, INC. (1)
6,029,141 Internet-based customer referral system		1156	1997
GILLESPIE, ROBB S. (1)
6,481,939 Tool tip conductivity contact sensor and method		91	2001
National Metal Refining Company (1)
4,566,184 Process for making a probe for high speed integrated circuits		100	1984
AMAZON.COM, INC. (1)
5,960,411 Method and system for placing a purchase order via a communications network		1542	1997
MARTIN MARIETTA CORPORATION (1)
5,867,073 Waveguide to transmission line transition		84	1994
SOCIONEXT INC. (1)
6,466,046 Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor		26	1999
ELECTRONICS RESEARCH, INC. (1)
2004/0100,276 Method and apparatus for calibration of a vector network analyzer		101	2002
INTELLECTUAL VENTURES I LLC (1)
5,633,780 Electrostatic discharge protection device		133	1996
ERS Electronic GmbH (1)
2005/0227,503 Method and device for conditioning semiconductor wafers and/or hybrids		47	2005
BANK OF AMERICA, N.A. (1)
2004/0267,691 System and method to monitor performance of different domains associated with a computer system or network		48	2003
GE CAPITAL EQUITY INVESTMENTS, INC. (1)
6,628,980 Apparatus, systems, and methods for in vivo magnetic resonance imaging		185	2001
CIRREX SYSTEMS, LLC (1)
6,222,970 Methods and apparatus for filtering an optical fiber		148	1999
SCHLUMBERGER TECHNOLOGY CORPORATION (1)
4,766,384 Well logging apparatus for determining dip, azimuth, and invaded zone conductivity		101	1986
The United States of America as represented by the Secretary of the Army (1)
6,731,804 Thermal luminescence liquid monitoring system and method		81	2000
SYNOPSYS, INC. (1)
5,682,337 High speed three-state sampling		54	1995
The United States of America as represented by the Secretary of the Air Force (7)
4,365,109 Coaxial cable design		61	1981
4,507,602 Measurement of permittivity and permeability of microwave materials		74	1982
4,712,370 Sliding duct seal		58	1986
4,754,239 Waveguide to stripline transition assembly		91	1986
5,631,571 Infrared receiver wafer level probe testing		145	1996
6,215,295 Photonic field probe and calibration means thereof		115	1998
2003/0170,898 Method for intracellular modifications within living cells using pulsed electric fields		125	2002
STORAGE TECHNOLOGY CORPORATION (1)
5,469,324 Integrated decoupling capacitive core for a printed circuit board and method of making same		122	1994
Litel Instruments (1)
5,094,536 Deformable wafer chuck		54	1990
INIZIATIVE MARITTIME 1991, S.R.L. (1)
5,245,292 Method and apparatus for sensing a fluid handling		75	1992
HITACHI HIGH-TECH SCIENCE CORPORATION (1)
6,621,082 Automatic focusing system for scanning electron microscope equipped with laser defect detection function		100	2002
Trio-Tech International (2)
6,104,203 Test apparatus for electronic components		53	1996
6,605,955 Temperature controlled wafer chuck system with low thermal resistance		104	2000
Signatone Corporation (1)
4,845,426 Temperature conditioner for tests of unpackaged semiconductors		108	1987
TRUSTEES OF DARTMOUTH COLLEGE (1)
5,833,601 Methodology for determining oxygen in biological systems		85	1997
ANALOG DEVICES, INC. (1)
5,712,571 Apparatus and method for detecting defects arising as a result of integrated circuit processing		56	1995
NANOMETRICS INCORPORATED (1)
4,818,169 Automated wafer inspection system		138	1985
General Dielectric, Inc. (1)
2002/0050,828 Multi-feed microwave reflective resonant sensors		79	2001
DELTA DESIGN, INC. (1)
6,549,026 Apparatus and method for temperature control of IC device during test		70	2000
Aehr Test Systems (2)
6,340,895 Wafer-level burn-in and test cartridge		107	1999
6,580,283 Wafer level burn-in and test methods		88	1999
The Johns Hopkins University (1)
6,284,971 Enhanced safety coaxial cables		151	1999
Ignite Sales, Inc. (1)
6,236,975 System and method for profiling customers for targeted marketing		502	1998
EUROPAEISCHES LABORATORIUM FUER MOLEKULARBIOLOGIE (EMBL) (1)
6,798,226 Multiple local probe measuring device and method		93	2002
APPLIED MATERIALS, INC. (7)
5,486,975 Corrosion resistant electrostatic chuck		68	1994
5,916,689 Electrostatic chuck with an impregnated, porous layer that exhibits the Johnson-Rahbeck effect		122	1996
5,874,361 Method of processing a wafer within a reaction chamber		108	1996
6,257,564 Vacuum chuck having vacuum-nipples wafer support		108	1998
6,232,787 Microstructure defect detection		161	1999
6,310,755 Electrostatic chuck having gas cavity and method		100	1999
6,468,816 Method for sensing conditions within a substrate processing system		46	2001
KAWASAKI MICROELECTRONICS, INC. (1)
6,924,656 Method and apparatus for testing BGA-type semiconductor devices		21	2003
East Giant Limited (1)
5,879,289 Hand-held portable endoscopic camera		167	1996
SOHN, LYDIA L. (1)
2003/0072,549 Method and apparatus for dielectric spectroscopy of biological solutions		114	2002
Dimension Polyant Sailcloth, Inc. (1)
6,013,586 Tent material product and method of making tent material product		91	1997
GYRUS MEDICAL LIMITED (1)
6,409,724 Electrosurgical instrument		260	2000
TOKYO ELECTRON LIMITED (33)
4,884,026 Electrical characteristic measuring apparatus		73	1988
5,084,671 Electric probing-test machine having a cooling system		189	1990
5,091,692 Probing test device		116	1990
5,198,752 Electric probing-test machine having a cooling system		156	1991
5,315,237 Touch sensor unit of prober for testing electric circuit and electric circuit testing apparatus using the touch sensor unit		113	1991
5,278,494 Wafer probing test machine		94	1992
5,321,352 Probe apparatus and method of alignment for the same		132	1992
5,321,453 Probe apparatus for probing an object held above the probe card		103	1992
5,325,052 Probe apparatus		145	1992
5,410,259 Probing device setting a probe card parallel		141	1993
5,404,111 Probe apparatus with a swinging holder for an object of examination		113	1993
5,521,522 Probe apparatus for testing multiple integrated circuit dies		144	1993
5,539,676 Method of identifying probe position and probing method in prober		94	1994
5,550,482 Probe device		101	1994
5,777,485 Probe method and apparatus with improved probe contact		119	1996
5,640,101 Probe system and probe method		69	1996
5,828,225 Semiconductor wafer probing apparatus		71	1996
5,910,727 Electrical inspecting apparatus with ventilation system		90	1996
5,804,983 Probe apparatus with tilt correction mechanisms		152	1997
5,926,028 Probe card having separated upper and lower probe needle groups		38	1997
5,999,268 Apparatus for aligning a semiconductor wafer with an inspection contactor		118	1997
6,060,892 Probe card attaching mechanism		98	1997
6,037,793 Inspecting method and apparatus for semiconductor integrated circuit		73	1998
6,124,725 Apparatus and method for testing semiconductor devices formed on a semiconductor wafer		136	1998
6,501,289 Inspection stage including a plurality of Z shafts, and inspection apparatus		84	2000
6,414,478 Transfer mechanism for use in exchange of probe card		80	2000
6,739,208 Method of delivering target object to be processed, table mechanism of target object and probe apparatus		27	2001
7,005,842 Probe cartridge assembly and multi-probe assembly		93	2001
7,101,797 Substrate processing device and processing method		46	2003
6,794,888 Probe device		76	2003
7,026,832 Probe mark reading device and probe mark reading method		96	2003
7,009,415 Probing method and probing apparatus		95	2004
7,023,226 Probe pins zero-point detecting method, and prober		93	2004
NGK INSULATORS, LTD. (2)
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* Cited By Examiner

Patent Citation Ranking

Forward Cite Landscape

Patent Info	(Count)	# Cites	Year
Other [Check patent profile for assignment information] (1)
* 2009/0302,234 Method and Apparatus for Observing Inside Structures, and Specimen Holder		4	2008
FormFactor, Inc. (2)
* 8,130,005 Electrical guard structures for protecting a signal trace from electrical interference		0	2006
* 2008/0143,358 ELECTRICAL GUARD STRUCTURES FOR PROTECTING A SIGNAL TRACE FROM ELECTRICAL INTERFERENCE		38	2006
MAUI IMAGING, INC. (1)
* 2010/0262,013 Universal Multiple Aperture Medical Ultrasound Probe		18	2010
SIGNATURE CONTROL SYSTEMS, INC. (1)
* 8,104,190 Wood kiln moisture measurement calibration and metering methods		2	2010
HITACHI, LTD. (1)
* 8,134,131 Method and apparatus for observing inside structures, and specimen holder		7	2008
CASCADE MICROTECH, INC. (2)
7,969,173 Chuck for holding a device under test		2	2007
8,319,503 Test apparatus for measuring a characteristic of a device under test		1	2009

* Cited By Examiner

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Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

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Full Text

US Patent No: 7,498,828

Probe station with low inductance path

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