Shielded probe for testing a device under test
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United States of America Patent
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-
Mar 10, 2009
Grant Date -
Feb 21, 2008
app pub date -
Oct 19, 2007
filing date -
May 23, 2003
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies may include a dielectric substrate that supports a signal path interconnecting test instrumentation and a probe tip and a ground path that shields both the signal path and the probe tip.
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