Selecting and using storage devices based on functional tests and probable time to failure
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United States of America Patent
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Mar 10, 2009
Grant Date -
Nov 2, 2006
app pub date -
Apr 29, 2005
filing date -
Apr 29, 2005
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The present invention includes combining mass storage devices having different probable time to failures into a single data storage system, so that most of the mass storage devices don't crash or become inoperable at the same time, such as when the system is exposed to a most probable failure causing setting or circumstances for the mass storage devices. Embodiments also include using a tiered system of functional testing, to identify “premium” mass storage devices for use in a premium data storage system, as compared to “standard” devices. The premium mass storage devices may not include reworked devices or components, and may have to pass a more stringent functional test than a test for a “standard” device. Also contemplated is use of a data storage system or server having standard or premium mass storage devices, and/or groups of mass storage device with different probable time to failure.
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