Shielded probe for testing a device under test

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 7518387
APP PUB NO 20080024149A1
SERIAL NO

11906055

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
FORMFACTOR INC7005 SOUTHFRONT ROAD LIVERMORE CA 94551

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Andrews, Mike Cornelius, US 61 1625
Dunklee, John Tigard, US 36 578
Gleason, K Reed Portland, US 49 1851
Hayden, Leonard Beaverton, US 26 488
Lesher, Tim Portland, US 18 263
Martin, John Portland , US 232 6499
Safwat, Amr M E Cairo, EG 8 170
Strid, Eric W Portland, US 33 2095

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation