Method and apparatus for bit error rate analysis

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United States of America Patent

PATENT NO 7519874
APP PUB NO 20040123191A1
SERIAL NO

10673712

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Abstract

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A method and apparatus for determining a bit error rate. The method comprises the steps of acquiring a data signal by an acquisition unit of a test instrument for a predetermined period of time, and storing the data signal in a memory of the test instrument. A clock signal is recovered from the stored data signal, and in accordance therewith, the stored data signal is sliced into a plurality of data segments of a predetermined length. Each of said data segments is synchronized to a frame or predetermined pattern to determine a bit error rate thereof.

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Patent Owner(s)

Patent OwnerAddress
TELEDYNE LECROY INCC/O 1049 CAMINO DOS RIOS THOUSAND OAKS CA 91360

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Campiche, Thierry Geneva, CH 8 79
Miller, Martin Avusy, CH 59 563
Salant, Lawrence New Hempstead, US 2 45
Schnecker, Michael Doylestown, US 6 65

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