Surface topology improvement method for plug surface areas

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United States of America Patent

PATENT NO 7521364
APP PUB NO 20070128870A1
SERIAL NO

11380988

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Abstract

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The surface topology of a plug surface area-containing surface of a semiconductor device can be improved by removing material to create a first planarized surface with at least one plug surface area, typically a tungsten or copper plug area, comprising a recessed region. A material is deposited onto the first planarized surface, to create a material layer, and into the upper portion of the recessed region. The material layer is removed to create a second planarized surface with the material maintained in the upper portion of the recessed region. To form a semiconductor phase change memory device, a phase change element is formed between the at least one plug area, acting as a first electrode, at the second planarized surface and a second electrode.

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Patent Owner(s)

Patent OwnerAddress
MACRONIX INTERNATIONAL CO LTDNO 16 LI HSIN ROAD SCIENCE-BASED INDUSTRIAL PARK HSINCHU

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Shih Hung Elmsford, US 24 1797

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