Apparatus and methods for testing the life of a leakage current protection device
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United States of America Patent
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Apr 21, 2009
Grant Date -
Jun 28, 2007
app pub date -
Oct 26, 2006
filing date -
Dec 27, 2005
priority date (Note) -
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Abstract
An apparatus for testing the life of a leakage current protection device, comprising a microcontroller unit, at least one of a first fault detector and a second fault detector, at least one of an audio alarm and a visual alarm, a power supply circuit. In operation, the first fault detector and/or the second fault detector receive at least one signal from the leakage current protection device, and generate at least one DC voltage corresponding to the at least one signal to be received by the MCU. The MCU compares the at least one DC voltage with a predetermined threshold value to determine whether a fault exists in the leakage current protection device, and activates the alarm circuit if at least one fault exists.
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