Systems and methods for resistance compensation in a temperature measurement circuit
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United States of America Patent
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Apr 28, 2009
Grant Date -
Oct 23, 2008
app pub date -
Apr 23, 2007
filing date -
Apr 23, 2007
priority date (Note) -
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Abstract
Various systems and methods for temperature measurement are disclosed. For example, some embodiments of the present invention provide methods for temperature measurement that include exciting a provided transistor with at least four sequential input signals of different magnitudes. In response, the transistor exhibits a sequence of output signals corresponding to the four sequential input signals. The sequence of output signals is sensed using a different gain for each of the output signals included in the sequence of output signals, and the output signals included in the sequence of output signals are combined such that the combined output signals eliminates a resistance error. The combined output signals are then used to calculate a temperature of the transistor.
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