Model-based localization and measurement of miniature surface mount components

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United States of America Patent

PATENT NO 7526140
APP PUB NO 20050169512A1
SERIAL NO

11072220

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A system and method for object inspection includes an object modeler; an iterative object segmentor in signal communication with the object modeler for receiving an input image and model parameters and producing a segmented image; a moment transformer in signal communication with the iterative object segmentor for receiving an input image, model parameters and a segmented image and producing estimates of object translation, rotation and scaling; an edge detector and interpolator in signal communication with the moment transformer for receiving an input image, model parameters and estimates and producing a set of line edges; and an iterative optimizer in signal communication with the edge detector and interpolator for receiving an input image, model parameters, estimates and line edges and producing refined estimates of object translation, rotation and scaling.

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Patent Owner(s)

  • SIEMENS CORPORATE RESEARCH, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fang, Ming Princeton Jct. , US 136 2315
Tyan, Jenn-Kwei Princeton, US 7 250

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