Systems and methods for detecting scattered light from a particle using illumination incident at an angle

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United States of America Patent

PATENT NO 7532327
APP PUB NO 20060227324A1
SERIAL NO

11231350

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Abstract

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A particle detection system uses illumination incident at an angle to detect particles in a liquid such as water. By using illumination incident at an angle, the scattered light can be measured through a range of angles that are greater than the measured range of angles produced when the illumination is incident at a normal angle, when using the same detector. For example, the light can be measured through an angle that is twice that produced with illumination incident at a normal angle.

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Patent Owner(s)

Patent OwnerAddress
JMAR LLC A DELAWARE LIMITED LIABILITY COMPANY10905 TECHNOLOGY PLACE SAN DIEGO CA 92127

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Adams, John A Escondido , US 53 2753
Aguirre, Alex San Diego , US 2 45
Bloom, Scott H Encinitas , US 20 599
Crousore, Kristina M Oceanside , US 7 119
Spivey, Brett A Carlsbad , US 15 322
Tutrow, Michael Solana Beach , US 2 53

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