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Abstract

A method and circuitry for calibration of the output impedance of output driver circuits in an integrated circuit is disclosed. The output drivers within an area on the integrated circuit are defined as a group, and an output model indicative of the operation of the output drivers and used to calibrate their output impedances is provided proximate to the output drivers. A state machine is used to query each output model, and to set the proper output enable signals for the enable transistors in the output drivers in each group so as to calibrate their output impedances. By decentralizing the output models, the process used to form the output models will, due to proximity to the output drivers in each group, be indicative of the process used to form the output drivers. Thus, when each group of output drivers is calibrated, the output models used for each will compensate for process variations as may occur across the surface of the integrated circuit. Each group of output drivers is thus separately calibrated, with the result that the output impedances are made more uniform across the various output drivers despite process variations.

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