Anti-symmetrized electromagnetic measurements

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United States of America Patent

PATENT NO 7536261
APP PUB NO 20060253255A1
SERIAL NO

11279739

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Abstract

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A method to determine a parameter of a subsurface formation such as anisotropy and dip comprises making at least two cross dipole measurements and forming an anti-symmetrized combination from the at least two cross dipole measurements.

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Patent Owner(s)

Patent OwnerAddress
SCHLUMBERGER TECHNOLOGY CORPORATION300 SCHLUMBERGER DRIVE SUGAR LAND TX 77478

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Minerbo, Gerald N Missouri City, US 31 906
Omeragic, Dzevat Lexington , US 71 2297
Rosthal, Richard A Houston, US 37 1638

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