Apparatus and method for measuring optical characteristics of an object

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United States of America Patent

PATENT NO 7538878
SERIAL NO

11827439

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Abstract

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A system for applying pigment to a substrate includes a spectrophotometer integral to the system. Light received from the substrate is spectrally analyzed by a spectrometer. One or more pigment discharges apply one or more pigments to the substrate. The spectrometer spectrally analyzes the one or more pigments applied to the substrate. The spectrometer includes an optical sensing circuit having thereon a plurality of optical sensors and one or more processing elements. A plurality of filter elements are fixedly positioned over at least a first group of the optical sensors, and an optical manifold having a plurality of exit windows and at least one entrance port is fixedly positioned with respect to the plurality of filter elements.

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Patent Owner(s)

Patent OwnerAddress
RPX CORPORATIONFOUR EMBARCADERO SUITE 4000 SAN FRANCISCO CA 94111

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Jung, Russell W Morton Grove, US 100 3928
Jung, Wayne D Morton Grove, US 116 4500
Loudermilk, Alan R Chicago, US 136 4790

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