Probe receptacle for mounting a probe for testing semiconductor components, probe holder arm and test apparatus

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 7560942
APP PUB NO 20080116911A1
SERIAL NO

11674208

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

To arrange a probe needle in a reproducible manner, ensure reliable contact-connection of the probe needle and ensure that the probe needle is held securely even at high temperatures or test forces, a probe receptacle is provided for mounting a probe for testing semiconductor components. The probe has a probe needle and an essentially prismatic probe shaft. The probe receptacle comprises a base having a socket opening to receive the prismatic probe shaft, surrounded by a base wall. The base wall comprises at least two base wall segments which can be moved toward one another. A probe holder arm having such a probe receptacle, and test apparatus having at least one probe which has such a probe receptacle are also provided.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

  • CASCADE MICROTECH, INC.

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Becker, Axel Dresden , DE 44 215
Fleischer, Hans-Jurgen Priestewitz , DE 7 38
Kanev, Stojan Sacka , DE 44 174
Schmidt, Axel Stolpchen , DE 71 623

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation