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Abstract

An optoelectronic probe system with all-optical coupling includes an optoelectronic measuring console coupled with an optoelectronic probe via an optical connector. A supplemental optical signal having an operative wavelength other than an operative wavelength of the regular optical part of the optoelectronic measuring console is communicated to the optoelectronic probe along with the output signal from the optoelectronic measuring console. The supplemental optical signal is then selected by a wavelength-division multiplexer, converted to an electrical signal and used for powering respective components of the optoelectronic probe. Auxiliary signals are also used for identification and storing calibration parameters of the optoelectronic probe, counting events, such as number of sessions used, time in use, and the like.

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First Claim