Method and system for measuring a coating thickness
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United States of America Patent
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Aug 11, 2009
Grant Date -
N/A
app pub date -
Jun 2, 2008
filing date -
Jun 2, 2008
priority date (Note) -
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status (Latency Note)
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Abstract
A method of measuring a coating thickness involves projecting a pattern of light on a surface. A first reflection of the pattern of light is received by a first image capturing device. A second reflection of the pattern of light is received by an image capturing device which may be the same or a different image capturing device. The first reflection is compared with the second reflection. A first dated map of the surface is created by comparing the first reflection and the second reflection. A coating is deposited on the surface. A second data map of the surface with the coating is created by comparing reflections. The first data map and the second data map are then compared to determine a thickness of the coating.
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