In-process vision detection of flaws and FOD by back field illumination
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United States of America Patent
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Aug 18, 2009
Grant Date -
Nov 13, 2008
app pub date -
Jul 25, 2008
filing date -
Nov 24, 2004
priority date (Note) -
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status (Latency Note)
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Abstract
A flaw and foreign object debris (FOD) detection system (11) for use during fabrication of a structure (12) includes an illumination device (13). The illumination device (13) is configured to be in proximity with a fabrication system (10) and illuminates a portion (18) of the structure (12). The illumination device (13) directs light rays (16) at acute angles relative to the portion (18). A detector (14) monitors the portion (18) and detects FOD in the portion (18) during fabrication of the structure (12) in response to the reflection of the light rays (16) off of the portion (18).
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