Electrical characterization of interferometric modulators
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United States of America Patent
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Aug 25, 2009
Grant Date -
Jul 3, 2008
app pub date -
Mar 3, 2008
filing date -
Sep 27, 2004
priority date (Note) -
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Abstract
Disclosed herein are methods and systems for testing the electrical characteristics of reflective displays, including interferometric modulator displays. In one embodiment, a controlled voltage is applied to conductive leads in the display and the resulting current is measured. The voltage may be controlled so as to ensure that interferometric modulators do not actuate during the resistance measurements. Also disclosed are methods for conditioning interferometric modulator display by applying a voltage waveform that causes actuation of interferometric modulators in the display.
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