Self referencing heterodyne reflectometer and method for implementing

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United States of America Patent

PATENT NO 7589843
APP PUB NO 20070109551A1
SERIAL NO

11528732

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Abstract

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, generated from the SR/AM beam, which are used for calculating film thickness.

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Patent Owner(s)

Patent OwnerAddress
VERITY INSTRUMENTS INC2901 EISENHOWER STREET CARROLLTON TX 75007

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Aiyer, Arun Ananth Lewisville , US 13 157
Meloni, Mark A Longmont , US 12 271

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