
US Patent No: 7,592,817
Number of patents in Portfolio can not be more than 2000
Alignment correction system and method of use
Stats
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Sep 22, 2009
Issued date -
Jul 17, 2007
filing date -
11/778,679
serial no -
In Force
status
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Abstract
A system and method for correcting alignment of a product on a tool and, more particularly, to a system and method for correcting alignment of a wafer on a chuck of a tool. The system is a tool comprising at least one contact near a circumference of the tool and a grounded contact proximate to the at least one contact. The method comprises measuring current on each branch of a circuit and calculating an angle of a wafer based on a difference in the current on each branch of the circuit.
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First Claim
Related Publications
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International Classification(s)
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Cited Art
| Patent Info | (Count) | # Cites | Year |
|---|---|---|---|
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| 5,759,007 Notch finder and combination wafer transfer machine | 5 | 1996 | |
| 6,456,378 Semiconductor wafer alignment methods and semiconductor wafer alignment tools | 3 | 2001 | |
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| 4,457,664 Wafer alignment station | 75 | 1982 | |
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| 5,551,829 Notch finder having a flexible alignment rod | 9 | 1995 | |
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| 7,123,362 Method for aligning wafer | 1 | 2004 | |
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| 7,388,385 Wafer dicing system | 1 | 2005 | |
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| 6,324,298 Automated wafer defect inspection system and a process of performing such inspection | 118 | 1999 | |
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| 7,494,830 Method and device for wafer backside alignment overlay accuracy | 2 | 2007 | |
Patent Citation Ranking
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