Method for estimating end use qualities of wheat at growth stage

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United States of America Patent

PATENT NO 7598038
APP PUB NO 20080213758A1
SERIAL NO

11662781

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Abstract

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The invention provides a means for estimating the end use qualities of wheat flour that will be obtained in the future from the harvested wheat at an early stage before maturation of the wheat seeds. The invention relates to a method for estimating the end use qualities of a matured wheat seed, comprising measuring the expression level of at least 1 gene selected from genes, each of which is defined by any one of the nucleotide sequences of SEQ ID NOS: 1 to 121 in immature wheat.

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Patent Owner(s)

Patent OwnerAddress
NISSHIN SEIFUN GROUP INC25 KANDA-NISHIKI-CHO 1-CHOME CHIYODA-KU TOKYO 101-8441
ORIENTAL YEAST CO LTD3-6-10 AZUSAWA ITABASHI-KU TOKYO 1748505 ?1748505

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hayakawa, Katsuyuki Saitama , JP 12 63
Kikuchi, Yosuke Saitama , JP 21 210
Kinugasa, Masahiro Shiga , JP 5 6
Motoi, Hirofumi Saitama , JP 6 39
Uchida, Kouji Shiga , JP 19 160

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